ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,737,865, issued on Sept. 15, was assigned to RESONAC Corp. (Tokyo). "Program, condition search apparatus, and condition search method" was inv... Read More
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,737,866, issued on Sept. 15, was assigned to NEC Corp. (Tokyo). "Road deterioration diagnosing device, road deterioration diagnosing method, a... Read More
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,737,867, issued on Sept. 15, was assigned to FEI COMPANY (Hillsboro, Ore.). "Few-shot learning for processing microscopy images" was invented ... Read More
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,737,868, issued on Sept. 15, was assigned to CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) Ltd. (Hong Kong). "Defect detection method, device an... Read More
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,737,869, issued on Sept. 15, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Semiconductor yield prediction method and ... Read More
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,737,870, issued on Sept. 15, was assigned to CHINA PETROLEUM & CHEMICAL Corp. (Beijing) and SINOPEC RESEARCH INSTITUTE OF SAFETY ENGINEERING Co... Read More
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,737,871, issued on Sept. 15, was assigned to MAKEBLOCK HONGKONG HOLDING Ltd. (Hongkong, China). "Edge detection for computer numerically contr... Read More
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,737,872, issued on Sept. 15, was assigned to Volume Graphics GmbH (Heidelberg, Germany). "Computer-implemented method for measuring an object"... Read More
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,737,873, issued on Sept. 15, was assigned to Brother Kogyo K.K. (Nagoya, Japan). "Inspection apparatus and storage medium storing computer pro... Read More
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,737,874, issued on Sept. 15, was assigned to HITACHI ASTEMO LTD. (Ibaraki, Japan). "Visual inspection apparatus, visual inspection method, ima... Read More